Epitaxy Characterisation
Full electro-optical analyses of your LED wafers.
Fast, standardised wafer-level feedback to help you optimise GaN epitaxy and compare growth batches with consistent, decision-ready metrics. We convert your LED wafers into functional microLED test structures and deliver comprehensive electro-optical characterisation in a clean, comparable report format.
With QubeDot
Standardised test structures + repeatable measurement flow
Wafer-scale electro-optical datasets you can compare across batches
Faster iteration on growth parameters and supplier / incoming wafer QC
The problem
Slow, expensive characterisation cycles with limited comparability between runs.
High barrier to in-house capability (cleanroom, equipment, specialised staff).
Hard to isolate process changes without standardized wafer-scale data.
Key Specifications
Wafer-Scale Electro-Optical Mapping
Comparable metrics across customer-defined regions or full wafer coverage, enabling quick batch-to-batch benchmarking.
MicroLED Test Structures Down to 5 µm
Fabricated test devices and patterns designed to reflect display-relevant pixel dimensions and performance.
Standardised Outputs for Faster Decisions
Raw data exports + analysed PDF reporting with statistical outputs (mean, min/max, distributions).
Turnaround
Typical turnaround ~3 weeks depending on batch size.
High-performance µLED illumination. 800 × 800 µm² field of view. This is what portable analysis looks like.
High-performance µLED illumination. 800 × 800 µm² field of view. This is what portable analysis looks like.
Technical details
Wafer size
Up to 6″ (GaN-on-Si; >6″ can be cut down to 6″)
microLED dimensions
Down to 5 µm
IV sweep range
−20 V to +20 V
Spectral range
350 nm – 1000 nm
Turnaround
~3 weeks (batch dependent)
Our LEDs find space in the tiniest of places, they can be packed as closely or as densely as possible.
All our products and displays are fully configurable, dimensions, pixel layout, and symbology are tuned to your application. For full specifications download datasheet.
SPC
Sedimented Particle Counter
Need facility-wide cleanroom monitoring, but more efficient?