Semiconductor Analysis
See what’s really happening in your semiconductor.
Comprehensive characterisation services for GaN and III-V semiconductors. From surface topography to deep-layer analysis, we give you the data you need to understand your material, validate your process, or troubleshoot your device. Advanced equipment. Expert interpretation. Clear results.
With QubeDot
One partner for all your semiconductor characterisation needs
Equipment operated by people who understand GaN at a fundamental level
Results that come with context, not just numbers, but what they mean for your device
From simple analytics to advanced cross-sectional analysis, all under one roof
The problem
Sending samples to multiple labs for different analyses
Weeks of waiting for results from each one
Reports that give you data but not answers
No one who understands your GaN device well enough to interpret the results
Key Specifications
See the Structure, In 3D
Laser Scanning Microscopy (LSM) lets you visualise your structures and compare them to your design in full 3D. See surface topography, layer uniformity, and feature dimensions with nanometre-level precision.
Cross-Section Anything
Focused Ion Beam (FIB) milling lets us create arbitrary cross-sections through your device. Evaluate your layer stack, check interfaces, verify process quality, without guessing what’s underneath.
Go Deeper with Electron Microscopy
Scanning Electron Microscopy (SEM) with cathodoluminescence gives you optical property insights at the nanoscale. See structural details invisible to optical microscopy. Understand how your material performs, not just how it looks.
650 g. Aluminium housing. USB-C powered. Built to go wherever your samples are.
High-performance µLED illumination. 800 × 800 µm² field of view. This is what portable analysis looks like.
Technical details
LSM
Surface topography, 3D structure | 10 nm possible
SEM
Structural imaging | Sub-nanometre resolution
IVL
Electro-optical characteristics
IQE
Internal Quantum efficiency
Integrating Sphere
Total light output
Our LEDs find space in the tiniest of places, they can be packed as closely or as densely as possible.
All our products and displays are fully configurable, dimensions, pixel layout, and symbology are tuned to your application. For full specifications download datasheet.
What we process
Structural & Surface Analysis
- Laser Scanning Microscopy (LSM)
- Scanning Electron Microscopy (SEM)
Optical & Spectral Analysis
- Cathodoluminescence (CL)
- Time-Resolved Cathodoluminescence (TR-CL)
- µPhotoluminescence (µ-PL)
Compositional Analysis
- Energy-Dispersive X-ray Spectroscopy (EDX)
- Time-of-Flight Mass Spectroscopy (TOF-MS)
- Electrochemical Capacitance-Voltage (ECV)
Electrical Characterisation
- IV Characterisation
- IQE Measurements
- Integrating Sphere Measurements
SPC
Sedimented Particle Counter
Need facility-wide cleanroom monitoring, but more efficient?